Development of Soft X-ray Microanalysis using Windowless SDD Technology
نویسندگان
چکیده
منابع مشابه
Development of Soft X-ray Microanalysis using Windowless SDD Technology
New instrumentation which is sensitive to the detection of ultra low energy (<100eV) X-rays [1,2], promises new analysis capability for the SEM; so called ‘Soft X-ray Microanalysis’. Only those soft X-rays that are generated close to the surface of the sample escape and therefore they offer potential for surface and higher spatial resolution analysis. The detectability of very low energy K, L a...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614006217